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Photon-Emission-Guided Laser Fault Injection Enables RP2350 Secure Debug

The paper introduces a method for secure debugging of the RP2350 microcontroller using photon-emission-guided laser fault injection.

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Tracking sinceSeptember 18, 202668 source points
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PublishedSeptember 18, 2026synack
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This method could be used to enhance security by enabling controlled fault injection for debugging purposes.

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